SD and HD Multiple Line Idents and Multiple Test Patterns - Magnum Engineer
- 20 SD and HD Standards
- 40 Test Signals including Moving Zone Plate
- Lip Sync Test
- Keyboard Entered Idents
- VITC Generator
- Tri Level Sync Outputs
- Audio Tones
Black, Crosshatch ( 4x3 & 16x9), Dots, Crosshatch with dots, Pluge, 1T 2T 5T Pulse & Bar, Bowtie, Luminance + Chrominance Sweep, Luminance Sweep, Luminance + Chrominance Multiburst, Luminance Multiburst, SMPTE Bars, 75% Bars & Red, 75% bars, 100% Bars & Red, 100% Bars, Pathological Test Mixed, PLL Test, Cable Equalization Test, 10% & 100% Green Ramps, 10% & 100% Red Ramps, 10% & 100% Blue Ramps, Field Flicker, 20% & 100% White, 20% + 100% white, 100% Green,100% Red, 100% Blue, Shallow Chrominance Ramp, Shallow Luminance Ramp, Chrominance Ramp, Luminance Ramp. There are eight Zone Plates; which can be stationary or moving vertically, horizontally, diagonally or bouncing.
Each pattern can have overlaid: A circle (4x3 & 16x9), centre cross, bouncing zone plate ball, safe action cage, safe title cage and picture extremity cage. In addition moving saw teeth and display of the on board Time Code Generator.
Embedded audio can be selected between none, musical tones on all groups or one of the four groups with 1kHz tone on the lower half of the group and 2kHz tone on the upper half of the group. Both have the left hand channel interrupted. To aid the measurement of audio video delay the unit has a video audio clapper.
Up to four lines of text can be overlaid on the selected pattern. This is inputted via a standard PS2 keyboard.
|Formats||525 (480i)60, 625 (576i)50, 720p50, 720p59, 720p60
1080p23, 1080p24, 1080p25, 1080p29, 1080p30, 1080sf23, 1080sf24, 1080sf25, 1080sf29, 1080sf30, 1035i59, 1035i60, 1080i50, 1080i59, 1080i60
There are four outputs which can be switched between;
|Line Ident, Source Ident or Path Ident||Up to four lines of text can be overlaid on the selected pattern. This is inputted via a standard PS2 keyboard.|
|Power||98-125V or 198-250V 12VA Nomial|
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SD and HD Multiple Line Idents and Multiple Test Patterns